Comments on: “Yield & Reliability” http://chipdesignart.wordpress.com/2008/04/24/yield-reliability/ vlsi,chip,silicon,jobs,Life,family,Personal,thoughts,ASIC,semiconductor,verification Wed, 28 Oct 2009 02:55:36 +0000 http://wordpress.com/ hourly 1 By: ankit khare http://chipdesignart.wordpress.com/2008/04/24/yield-reliability/#comment-165 ankit khare Sat, 12 Jul 2008 19:23:36 +0000 http://chipdesignart.wordpress.com/?p=41#comment-165 which coverage you are asking? Mostly frequency based testing, current leakage and stress based are mostly the criteria which decide the faulty parts not to escape. Hence deciding yield which coverage you are asking? Mostly frequency based testing, current leakage and stress based are mostly the criteria which decide the faulty parts not to escape. Hence deciding yield

]]> By: shivakumar revanna http://chipdesignart.wordpress.com/2008/04/24/yield-reliability/#comment-144 shivakumar revanna Wed, 07 May 2008 13:50:14 +0000 http://chipdesignart.wordpress.com/?p=41#comment-144 Could you please tell me is there any relation between yeild and test coverage? Thanks, Shivakumar Could you please tell me is there any relation between yeild and test coverage?

Thanks,
Shivakumar

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